PTB > Structure > Division 7 > Department 7.1 > Working Group 7.11
| - | Calibration of X-ray detectors / cryogenic radiometry | |
| - | Characterization of optical components / reflectometry | |
| - | Layer thickness determination using X-ray reflectometry | |
| - | X-ray radiometry for astrophysical, biological and medical applications | |
| - | Small-angle X-ray scattering for size determination of nanoparticles |
An UHV reflectometer is available for reflectometry. An important application of reflectometry is the layer thickness determination, focused on SiO2 layers on Si in the thickness range from a few nm up to 1 µm, also on the surface of silicon spheres in connection with the redefinition of the unit kilogram.
Within the framework of scientific co-operations, detectors, filters and mirrors are characterized for future missions in astrophysics (ESA) and for plasma diagnostics (CEA). For the investigation of novel pore optics based on stacked silicon wafers, a dedicated beamline is being operated for ESA where a fixed-energy pencil beam is available.
Furthermore the energy-dependence of the biological effectiveness of X-rays is investigated and spectrally resolved measurements are performed on mammography and computer tomography units. A new main focus is the development of small-angle X-ray scattering for the traceable size determination of nanoparticles.